KS C IEC 60749-4:2003
Semiconductor devices－Mechanical and climatic test methods－Part 4：Damp heat, steady state, highly accelerated stress test(HAST)

Standard No.

KS C IEC 60749-4:2003

Release Date

2003

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60749-4:2020

Latest

KS C IEC 60749-4:2020

Scope

This standard aims to evaluate the reliability of non-sealed packaged semiconductor devices in a humid environment.

KS C IEC 60749-4:2003 history

• 2020 KS C IEC 60749-4:2020 Semiconductor devices — Mechanical and climatic test methods — Part 4: Damp heat, steady state,highly accelerated stress test(HAST)
• 2003 KS C IEC 60749-4:2003 Semiconductor devices－Mechanical and climatic test methods－Part 4：Damp heat, steady state, highly accelerated stress test(HAST)