KS C IEC 60749-17:2006
Semiconductor devices-Mechanical and climatic test methods-Part 17:Neutron irradiation
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KS C IEC 60749-17:2006
Standard No.
KS C IEC 60749-17:2006
Release Date
2006
Published By
Korean Agency for Technology and Standards (KATS)
Status
Be replaced
Replace By
KS C IEC 60749-17-2006(2016)
Latest
KS C IEC 60749-17:2021
Scope
Neutron radiation testing is a test for the resistance (susceptibili) of semiconductor devices due to deterioration in a neutron environment.
KS C IEC 60749-17:2006 history
2021
KS C IEC 60749-17:2021
Semiconductor devices - Mechanical and climatic test methods — Part 17: Neutron irradiation
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KS C IEC 60749-17-2006(2016)
2006
KS C IEC 60749-17:2006
Semiconductor devices-Mechanical and climatic test methods-Part 17:Neutron irradiation
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