KS D ISO 18118:2005
Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Standard No.

KS D ISO 18118:2005

Release Date

2005

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced 2020-01

Replace By

KS D ISO 18118-2020

Latest

KS D ISO 18118-2020

Scope

This standard describes the determination of homogeneous materials using Auger electron spectroscopy and X-ray photoelectron spectroscopy.

KS D ISO 18118:2005 history

• 2020 KS D ISO 18118-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
• 2005 KS D ISO 18118:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials