KS C IEC 60749-3:2002
Discrete semiconductor devices－Mechanical and climatic test methods－Part 3：External visual examination

Standard No.

KS C IEC 60749-3:2002

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60749-3:2019

Latest

KS C IEC 60749-3:2021

Scope

This standard specifies the materials, design, structure, marking, and finishing operations applicable to semiconductor devices.

KS C IEC 60749-3:2002 history

• 2021 KS C IEC 60749-3:2021 Semiconductor devices — Mechanical and climatic test methods — Part 3: External visual examination
• 2019 KS C IEC 60749-3:2019 Semiconductor devices — Mechanical and climatic test methods — Part 3: External visual examination
• 2002 KS C IEC 60749-3:2002 Discrete semiconductor devices－Mechanical and climatic test methods－Part 3：External visual examination