KS C IEC 60749-11:2002
Semiconductor devices－Mechanical and climatic test methods－Part 11：Rapid change of temperature－Two－fluid－bath method

Standard No.

KS C IEC 60749-11:2002

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60749-11:2020

Latest

KS C IEC 60749-11:2020

Scope

This test determines the device's resistance to sudden exposure to temperature thresholds or rapid changes.

KS C IEC 60749-11:2002 history

• 2020 KS C IEC 60749-11:2020 Semiconductor devices — Mechanical and climatic test methods —Part 11: Rapid change of temperature — Two-fluid-bath method
• 2002 KS C IEC 60749-11:2002 Semiconductor devices－Mechanical and climatic test methods－Part 11：Rapid change of temperature－Two－fluid－bath method