KS D 0257-2002
Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method

Standard No.

KS D 0257-2002

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS D 0257-2002(2017)

Latest

KS D 0257-2022

Replace

KS D 0257-1999

Scope

This standard specifies the bulk recombination lifetime of minority carriers in a silicon single crystal (hereinafter referred to as bulk lifetime or tB).

KS D 0257-2002 history

• 2022 KS D 0257-2022 Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
• 0000 KS D 0257-2002(2017)
• 2002 KS D 0257-2002 Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
• 0000 KS D 0257-1999