KS D ISO 22493:2012
Microbeam analysis－Scanning electron microscopy－Vocabulary

Standard No.

KS D ISO 22493:2012

Release Date

2012

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS D ISO 22493-2012(2017)

Latest

KS D ISO 22493:2022

Scope

This standard defines terms used in scanning electron microscopy (SEM) analysis. This standard is a systematic

KS D ISO 22493:2012 history

• 2022 KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
• 0000 KS D ISO 22493-2012(2017)
• 2012 KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary