GB/T 29852-2013
Test method for measuring phosphorus, arsenic and antimony in silicon materials used for photovoltaic applications by secondary ion mass spectrometry (English Version)

Standard No.
GB/T 29852-2013
Language
Chinese, Available in English version
Release Date
2013
Published By
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest
GB/T 29852-2013
Scope
This standard specifies the method for determining the content of phosphorus, arsenic and antimony in silicon materials for photovoltaic cells by secondary ion mass spectrometry (SIMS). This standard applies to the quantitative analysis of the content of donor impurities phosphorus, arsenic and antimony in silicon materials for photovoltaic cells, where the concentrations of phosphorus, arsenic and antimony are all greater than 1×1014atoms/cm3.

GB/T 29852-2013 history

  • 2013 GB/T 29852-2013 Test method for measuring phosphorus, arsenic and antimony in silicon materials used for photovoltaic applications by secondary ion mass spectrometry
Test method for measuring phosphorus, arsenic and antimony in silicon materials used for photovoltaic applications by secondary ion mass spectrometry



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