ISO/TS 17915:2013
Optics and photonics.Measurement method of semiconductor lasers for sensing
- Standard No.
- ISO/TS 17915:2013
- Release Date
- 2013
- Published By
- International Organization for Standardization (ISO)
- Latest
- ISO/TS 17915:2013
- Scope
- This Technical Specification describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. This Technical Specification is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. This Technical Specification is an application of ISO 13695, in which the physical bases are explained.
ISO/TS 17915:2013 Referenced Document
- ISO 13695 Optics and photonics - Lasers and laser-related equipment - Test methods for the spectral characteristics of lasers
ISO/TS 17915:2013 history
- 2013 ISO/TS 17915:2013 Optics and photonics.Measurement method of semiconductor lasers for sensing
