5.1 This procedure is suitable for manufacturing control and for verifying that the product meets specifications. It provides rapid, multi-element determinations with sufficient accuracy to assure product quality. The analytical performance data included may be used as a benchmark to determine if similar X-ray spectrometers provide equivalent precision and accuracy, or if the performance of a particular spectrometer has changed.
1.1 This test method covers the analysis of Ni-base alloys by wavelength dispersive X-ray Fluorescence Spectrometry for the determination of the following elements:
Element | Composition Range |
Manganese | 0.068201;% to 1.68201;% |
Phosphorus | 0.0088201;% to 0.0158201;% |
Silicon | 0.08 % to 0.68201;% |
Chromium | 1.68201;% to 228201;% |
Nickel | 238201;% to 778201;% |
Aluminum | 0.208201;% to 1.38201;% |
Molybdenum | 0.038201;% to 108201;% |
Copper | 0.0078201;% to 2.58201;% |
Titanium | 0.118201;% to 3.08201;% |
Niobium | 0.558201;% to 5.38201;% |
Iron | 0.178201;% to 468201;% |
Tungsten | 0.068201;% to 0.508201;% |
Cobalt | 0.048201;% to 0.358201;% |
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