SN/T 3346-2012
Determination of silicon,manganese,phosphorus,chromium,vanadium in chrome-vanadium steel.Wave dispersive X-ray fluorescence spectrometry (English Version)

Standard No.

SN/T 3346-2012

Language

Chinese, Available in English version

Release Date

2012

Published By

Professional Standard - Commodity Inspection

Latest

SN/T 3346-2012

Scope

This standard specifies the wavelength dispersive X-ray fluorescence spectrometry method for the determination of silicon, manganese, phosphorus, chromium and vanadium content in chromium vanadium steel. This standard is applicable to the determination of silicon, manganese, phosphorus, chromium and vanadium content in chromium vanadium steel. The measurement range is shown in Table 1.

SN/T 3346-2012 Referenced Document

• GB/T 1031 Geometrical Product Specifications(GPS).Surface texture:Profile method.Surface roughness parameters and their values
• GB/T 16597 Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods*， 2019-06-04 Update

SN/T 3346-2012 history

• 2012 SN/T 3346-2012 Determination of silicon,manganese,phosphorus,chromium,vanadium in chrome-vanadium steel.Wave dispersive X-ray fluorescence spectrometry