IEC 61788-17:2013
Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
- Standard No.
- IEC 61788-17:2013
- Release Date
- 2013
- Published By
- International Electrotechnical Commission (IEC)
- Status
- Replace By
- IEC 61788-17:2021 RLV
- Latest
- IEC 61788-17:2021 RLV
- Replace
- IEC 90/310/FDIS:2012
- Scope
- This part of IEC 61788 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20@ 21]2@ the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows: ?C Jcd : from 200 A/m to 32 kA/m (based on results@ not limitation); ?C Measurement resolution: 100 A/m (based on results@ not limitation).
IEC 61788-17:2013 history
- 0000 IEC 61788-17:2021 RLV
- 2013 IEC 61788-17:2013 Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
