ISO 11505:2012
Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

Standard No.
ISO 11505:2012
Release Date
2012
Published By
International Organization for Standardization (ISO)
Latest
ISO 11505:2012
Scope
This International Standard describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined. NOTE Any individual standard for a test material will have to specify a scope of a thickness of the surface layer as well as analyte elements, and include results of interlaboratory tests for validation of the methods.

ISO 11505:2012 history

  • 2012 ISO 11505:2012 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry



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