LST EN 60749-29-2011
Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test (IEC 60749-29:2011)

Standard No.

LST EN 60749-29-2011

Release Date

2011

Published By

Lithuanian Standards Office

Latest

LST EN 60749-29-2011

Replace

LST EN 60749-29-2004 LST EN 60749-29-2004/AC-2005

LST EN 60749-29-2011 history

• 2011 LST EN 60749-29-2011 Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test (IEC 60749-29:2011)
• 0000 LST EN 60749-29-2004