LST EN 60749-32-2004 Semiconductor devices. Mechanical and climatic test methods. Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002)
2004LST EN 60749-32-2004 Semiconductor devices. Mechanical and climatic test methods. Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002)