LST EN 60749-30-2005
Semiconductor devices. Mechanical and climatic test methods. Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005)

Standard No.

LST EN 60749-30-2005

Release Date

2005

Published By

Lithuanian Standards Office

Latest

LST EN 60749-30-2005

LST EN 60749-30-2005 history

• 2005 LST EN 60749-30-2005 Semiconductor devices. Mechanical and climatic test methods. Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005)