IEC 62396-2:2012
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

Standard No.

IEC 62396-2:2012

Release Date

2012

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced

Replace By

IEC 62396-2:2017

Latest

IEC 62396-2:2017

Replace

IEC 107/186/FDIS:2012 IEC/TS 62396-2:2008

Scope

This part of IEC 62396 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways@ using different kinds of radiation sources@ it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry@ this process may be applied by other industrial sectors.

IEC 62396-2:2012 history

• 2017 IEC 62396-2:2017 Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
• 2012 IEC 62396-2:2012 Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems