With the rapid progress of the telecommunication terminal technology, more and more converged devices are appearing on the market. As the modules of the converged devices are so close together,if the printed circuit board (PCB) is not designed properly, without adequate earthing,shielding or filtering,an electromagnetic compatibility (EMC) disturbance can occur between the modules.Recommendation ITU-T K.94 analyses the EMC disturbance between different modules in converged terminal devices and defines a conducted test method. This mutual-disturbance test can be used as one of the immunity test items listed in Recommendation ITU-T K.34 and Recommendation ITU-T K.48 to determine the level of performance degradation.
ITU-T K.94-2012 Referenced Document
ITU-T K.34-2003 Classification of electromagnetic environmental conditions for telecommunication equipment Basic EMC Recommendation SERIES K: PROTECTION AGAINST INTERFERENCE Study Group 5
ITU-T K.48-2006 EMC requirements for telecommunication equipment Product family Recommendation Study Group 5
ITU-T K.94-2012 history
2012ITU-T K.94-2012 Mutual disturbance test method for evaluating performance degradation of converged terminal devices (Study Group 5)