This standard specifies the technical requirements for electronic probe quantitative analysis methods of rock minerals. This standard is suitable for quantitative analysis of rock minerals using electron probes that are relatively stable under electron beam bombardment. Its main content and basic principles are also applicable to quantitative analysis of scanning electron microscopy spectrometers.
SY/T 6027-2012 Referenced Document
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 4930-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for the specification of certified reference materials(CRMs)
SY/T 6027-2012 history
2019SY/T 6027-2019 Electron probe quantitative analysis method of rock minerals
2012SY/T 6027-2012 Quantitative analysis method of rock and mineral by electron probe microanalysis
1995SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals
SY/T 6027-2012 Quantitative analysis method of rock and mineral by electron probe microanalysis was changed to LST EN 60191-6-2010 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages (IEC 60191-6:2009).