DS/EN 62415:2010
Semiconductor devices - Constant current electromigration test

Standard No.

DS/EN 62415:2010

Release Date

2010

Published By

Danish Standards Foundation

Latest

DS/EN 62415:2010

Scope

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

DS/EN 62415:2010 history

• 2010 DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test