DS/EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Standard No.

DS/EN 62373:2006

Release Date

2006

Published By

Danish Standards Foundation

Latest

DS/EN 62373:2006

Scope

This standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).

DS/EN 62373:2006 history

• 2006 DS/EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)