DS/EN 60749-12:2003
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Standard No.

DS/EN 60749-12:2003

Release Date

2003

Published By

Danish Standards Foundation

Status

Be replaced 2003-12

Replace By

DS/EN 60749-12/Corr.1:2004

Latest

DS/EN 60749-12/Corr.1:2004

Scope

This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally appllicable to cavity-type packages. In general, this variable frequency vibration test is in conformity with IEC 60068-2-6 but, due to specific requirements of semiconductors, the clauses of this standard apply.

DS/EN 60749-12:2003 history

• 2004 DS/EN 60749-12/Corr.1:2004 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
• 2003 DS/EN 60749-12:2003 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency