DS/EN 60749-7:2011
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Standard No.

DS/EN 60749-7:2011

Release Date

2011

Published By

Danish Standards Foundation

Latest

DS/EN 60749-7:2011

Replace

DS/EN 60749-7-2002 DS/EN 60749-7/Corr.1-2003

Scope

This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.

DS/EN 60749-7:2011 history

• 2011 DS/EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases