DS/EN 60749-4:2003
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Standard No.

DS/EN 60749-4:2003

Release Date

2003

Published By

Danish Standards Foundation

Status

Be replaced 2003-12

Replace By

DS/EN 60749-4/Corr.1:2004

Latest

DS/EN 60749-4/Corr.1:2004

Scope

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semicondutor devices in humid environments.

DS/EN 60749-4:2003 history

• 2004 DS/EN 60749-4/Corr.1:2004 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
• 2003 DS/EN 60749-4:2003 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)