DS/EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Standard No.

DS/EN 60749-29:2011

Release Date

2011

Published By

Danish Standards Foundation

Latest

DS/EN 60749-29:2011

Replace

DS/EN 60749-29-2004

Scope

This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits.This test is classified as destructive.The purpose of this test is to establish a method for determining integrated circuit (IC) latchup characteristics and to define latch-up failure criteria. Latch-up characteristics are used determining product reliability and minimizing ""no trouble found"" (NTF) and ""electrical overstress"" (EOS) failures due to latch-up.This test method is primarily applicable to CMOS devices. Applicability to other technologies must be established.The classification of latch-up as a function of temperature is defined in 3.1 and the f

DS/EN 60749-29:2011 history

• 2011 DS/EN 60749-29:2011 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test