DS/EN 60749-23/A1:2011
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Standard No.

DS/EN 60749-23/A1:2011

Release Date

2011

Published By

Danish Standards Foundation

Latest

DS/EN 60749-23/A1:2011

Scope

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

DS/EN 60749-23/A1:2011 history

• 2011 DS/EN 60749-23/A1:2011 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
• 2004 DS/EN 60749-23:2004 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life