DS/EN 60749-18:2003
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Standard No.

DS/EN 60749-18:2003

Release Date

2003

Published By

Danish Standards Foundation

Latest

DS/EN 60749-18:2003

Scope

This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.

DS/EN 60749-18:2003 history

• 2003 DS/EN 60749-18:2003 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)