This International Standard applies to to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274.
DS/EN ISO 12179:2000 history
2007DS/EN ISO 12179/Corr. 1:2007 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments
2000DS/EN ISO 12179:2000 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments