NF C96-022-23/A1*NF EN 60749-23/A1:2012
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life.

Standard No.

NF C96-022-23/A1*NF EN 60749-23/A1:2012

Release Date

2012

Published By

Association Francaise de Normalisation

Latest

NF C96-022-23/A1*NF EN 60749-23/A1:2012

NF C96-022-23/A1*NF EN 60749-23/A1:2012 history

• 2012 NF C96-022-23/A1*NF EN 60749-23/A1:2012 Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life.