GB/T 5201-2012
Test procedures for semiconductor charged particle detectors (English Version)

Standard No.

GB/T 5201-2012

Language

Chinese, Available in English version

Release Date

2012

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 5201-2012

Replace

GB/T 5201-1994

Scope

This standard specifies the measurement methods for the electrical characteristics and nuclear radiation performance of charged particle semiconductor detectors and the test methods for some special environments. This standard applies to semiconductor detectors with partially depleted layers of charged particles. The measurement of fully depleted semiconductor detectors can be carried out with reference to this standard.

GB/T 5201-2012 Referenced Document

• GB/T 10263-2006 Environmental conditions and test procedures for nuclear radiation detectors
• GB/T 13178-2008 Partially depleted gold silicon surface barrier detectors
• GB/T 4960.6-2008 Glossary of terms for nuclear science and technology.Part 6: Nuclear instrumentation

GB/T 5201-2012 history

• 2012 GB/T 5201-2012 Test procedures for semiconductor charged particle detectors
• 1994 GB/T 5201-1994 Test procedures for semiconductor charged particle detectors