YS/T 276.10-2011 Methods for chemical analysis of indium.Part 10:Determination of bismuth,aluminium,lead,iron,copper,cadmium,tin and thallium content.Inductively coupled plasma atomic emission spectrometry (English Version)
Warning: Personnel using this standard should have practical experience in formal laboratory work. This standard does not address all possible safety issues. Users are responsible for taking appropriate safety and health measures and ensuring compliance with the conditions stipulated in relevant national regulations. Scope: This part of YS/T 276 specifies the method for the determination of inductively coupled plasma emission spectrometry of aluminum, bismuth, cadmium, copper, iron, lead, tin, and thallium in indium. This section is applicable to the simultaneous determination of aluminum, bismuth, cadmium, copper, iron, lead, tin, thallium and other elements in indium. It is also applicable to the determination of one of the elements or a combination of any several elements. The measurement range is the mass fraction of each element, see Table 1. Table 1 Mass fraction of each element (omitted)
YS/T 276.10-2011 history
2011YS/T 276.10-2011 Methods for chemical analysis of indium.Part 10:Determination of bismuth,aluminium,lead,iron,copper,cadmium,tin and thallium content.Inductively coupled plasma atomic emission spectrometry