YD/T 2342-2011
Reliability test method for optoelectronic devices used in telecommunications (English Version)
- Standard No.
- YD/T 2342-2011
- Language
- Chinese, Available in English version
- Release Date
- 2011
- Published By
- Professional Standard - Post and Telecommunication
- Latest
- YD/T 2342-2011
- Scope
- This standard specifies the general requirements and detailed requirements for reliability test methods of optoelectronic devices for communications, including: test purpose, equipment, conditions, procedures, inspection and failure criteria. This standard applies to optoelectronic devices for communications, including but not limited to laser diodes, light-emitting diodes, photodiodes, avalanche photodiodes and components or modules composed of them, referred to as "optoelectronic devices". Optoelectronic devices in other fields can also be used with reference.
YD/T 2342-2011 Referenced Document
- GB/T 19001-2008 Quality management systems.Requirements
- GB/T 21194-2007 Generic reliability assurance requirements for optoelectronic devices used in telecommunications equipment
YD/T 2342-2011 history
- 2011 YD/T 2342-2011 Reliability test method for optoelectronic devices used in telecommunications
