PD CEN/TR 10354:2011
Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
- Standard No.
- PD CEN/TR 10354:2011
- Release Date
- 2011
- Published By
- European Committee for Standardization (CEN)
- Status
- 2011-01
- Replace By
- PD CEN/TR 10354:2011(2012)
- Latest
- PD CEN/TR 10354:2011(2012)
- Scope
- This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in ferro-silicon materials. The method is applicable to:Si contents between 40 % and 90 %; Al contents between 0,5 % and 6 %. The correction of the spectrometric measurement from spectral interferences on the analytical lines used is essential. This Technical Report is valid for the analytical lines:Si K 7.126 (for element contents between 45 % and 90 %); Al K 8.339 (for element contents between 0,8 % and 6 %); Fe K 37 (for element contents between 10 % and 58 %). NOTE For matrix matching purposes, iron is included in the analytical program to be prepared. Within the conditions here above, spectral interferences don't need to be calculated.
PD CEN/TR 10354:2011 history
- 0000 PD CEN/TR 10354:2011(2012)
- 2011 PD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
