BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge
- Standard No.
- BS EN 60749-40:2011
- Release Date
- 2011
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN 60749-40:2011
- Replace By
- NF V08-010-4:2017
BS EN 60749-40:2011 history
- 2011 BS EN 60749-40:2011 Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge
