GB/T 26074-2010
Germanium monocrystal.Measurement of resistivity-DC linear four-point probe (English Version)
- Standard No.
- GB/T 26074-2010
- Language
- Chinese, Available in English version
- Release Date
- 2011
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Latest
- GB/T 26074-2010
- Scope
- This standard specifies the method for measuring the resistivity of germanium single crystal by DC four-probe method. This standard applies to the measurement of the thickness of the sample and the shortest distance from the edge of the sample to any probe end point, both of which are greater than 4 times the probe spacing. The resistivity of a germanium single wafer is 4 times smaller than the probe pitch. The measuring range is 1×10-3Ω•cm～1×102Ω•cm.
GB/T 26074-2010 history
- 2011 GB/T 26074-2010 Germanium monocrystal.Measurement of resistivity-DC linear four-point probe
