BS EN 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors
- Standard No.
- BS EN 62416:2010
- Release Date
- 2010
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN 62416:2010
- Scope
- This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
BS EN 62416:2010 history
- 2010 BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
