IEC PAS 61338-1-5:2010
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Standard No.
IEC PAS 61338-1-5:2010
Release Date
2010
Published By
International Electrotechnical Commission (IEC)
Status
Latest
IEC PAS 61338-1-5:2010
Scope
Microwave circuits are popularly formed on multi-layered organic or non-organic substrates. In the microwave circuits, the attenuation of planar transmission lines such as striplines, microstrip lines, and coplanar lines are determined by their conductor loss, dielectric loss and radiation loss. Among them, the conductor loss is a major factor in the attenuation of the planar transmission lines. A new measurement method is needed to evaluate the conductivity of transmission line on or in the substrates such as the organic, ceramic and LTCC (low temperature co-fired ceramics) substrates.

IEC PAS 61338-1-5:2010 history

  • 2010 IEC PAS 61338-1-5:2010 Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency



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