JIS Z 4334:2005
Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters

Standard No.

JIS Z 4334:2005

Release Date

2005

Published By

Japanese Industrial Standards Committee (JISC)

Status

Withdraw

Replace By

JIS Z 4334:2019

Latest

JIS Z 4334:2019

Replace

JIS Z 4334:1992

Scope

This standard specifies a large area standard source for calibrating radioactive surface contamination monitors. This standard applies to β-ray emitting nuclides (with a maximum energy of 0.15 MeV or more) and α-ray emitting nuclides, and specifies the characteristics of standard radiation sources that are calibrated using α-ray or β-ray surface emission rates. It does not specify how to calibrate radioactive surface contamination monitors using these sources.

JIS Z 4334:2005 Referenced Document

• JIS Z 4001 Glossary of terms used in nuclear energy
• JIS Z 4504 Evaluation of surface contamination -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters*， 2008-01-20 Update
• JIS Z 8103 Glossary of terms used in measurement*， 2019-05-20 Update

JIS Z 4334:2005 history

• 2019 JIS Z 4334:2019 Reference sources -- Calibration of surface contamination monitors -- Alpha-, beta- and photon emitters
• 2005 JIS Z 4334:2005 Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters
• 1992 JIS Z 4334:1992 Reference sources for the calibration of surface contamination monitors