GOST 20.57.406-1981 Complex quality control system. Electronic, quantum electronic and electrotechnical components. Test methods*, 1981-04-19 Update
GOST 22261-1982 Means for measuring of electrical quantities. General technical specifications*, 1982-04-19 Update
GOST 23089.1-1983 Integrated circuits. Method of measuring the operational amplifiers and voltage comparators gain*, 1983-04-19 Update
GOST 23089.10-1983 Integrated circuits. Method of measuring the operational amplifiers output voltage maximum build-up rate and time*, 1983-04-19 Update
GOST 23089.2-1983 Integrated circuits. Method of measuring the operational amplifiers maximum output voltage*, 1983-04-19 Update
GOST 23089.3-1983 Integrated circuits. Methods of measuring the operational amplifiers and voltage comparators zero offset voltage and emf*, 1983-04-19 Update
GOST 23089.4-1983 Integrated circuits. Method of measuring the input currents and input bias current of operational amplifiers and voltage comparators*, 1983-04-19 Update
GOST 23089.5-1983 Integrated circuits. Method of measuring the operational amplifiers and voltage comparators consumption current and power*, 1983-04-19 Update
GOST 23089.6-1983 Integrated circuits. Method of measuring the operational amplifiers output voltage settling time*, 1983-04-19 Update
GOST 23089.7-1983 Integrated circuits. Method of measuring the power sources instability effect on the operational amplifiers zero drift voltage and emf*, 1983-04-19 Update
GOST 23089.8-1983 Integrated circuits. Method of measuring the operational amplifiers average temperature voltage drift and zero offset emf*, 1983-04-19 Update
GOST 23089.9-1983 Integrated circuits. Method of measuring the operational amplifiers input bias current temperature drift and input currents*, 1983-04-19 Update
GOST 23089.0-1978 history
1978GOST 23089.0-1978 Integrated circuits. General requirements at measuring electrical parameters of operational amplifiers and voltage comparators