GB/T 25186-2010
Surface chemical analysis.Secondary-ion mass spectrometry.Determination of relative sensitivity factors from ion-implanted reference materials (English Version)

Standard No.
GB/T 25186-2010
Language
Chinese, Available in English version
Release Date
2010
Published By
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest
GB/T 25186-2010
Scope
This International Standard specifies a method for determining relative sensitivity factors in secondary ion mass spectrometry from ion-implanted reference materials. This standard applies to samples with a single matrix chemical composition, where the peak atomic concentration of the injected substance does not exceed 1%.

GB/T 25186-2010 Referenced Document

GB/T 25186-2010 history

  • 2010 GB/T 25186-2010 Surface chemical analysis.Secondary-ion mass spectrometry.Determination of relative sensitivity factors from ion-implanted reference materials
Surface chemical analysis.Secondary-ion mass spectrometry.Determination of relative sensitivity factors from ion-implanted reference materials


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