JIS K 0190:2010
Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Standard No.

JIS K 0190:2010

Release Date

2010

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS K 0190:2010

JIS K 0190:2010 Referenced Document

• ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

JIS K 0190:2010 history

• 2010 JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry