This standard specifies the main parameter series of X-ray analysis instruments (fully automatic X-ray diffractometer, X-ray directional analyzer, X-ray crystal analyzer, X-ray fluorescence spectrometer, etc.). This standard applies to X-ray analysis instruments.
JB/T 9399-2010 Referenced Document
JB/T 7406.2-1994 Testing machine terminology - Non-destructive test instrument
JB/T 9399-2010 history
2010JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
1999JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation