JIS C 2162:2010
Test method of long-term reliability of gate insulator for SiC devices at high temperature

Standard No.

JIS C 2162:2010

Release Date

2010

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS C 2162:2010

JIS C 2162:2010 history

• 2010 JIS C 2162:2010 Test method of long-term reliability of gate insulator for SiC devices at high temperature