NF C96-022-23*NF EN 60749-23:2004
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life.

Standard No.

NF C96-022-23*NF EN 60749-23:2004

Release Date

2004

Published By

Association Francaise de Normalisation

Latest

NF C96-022-23*NF EN 60749-23:2004

NF C96-022-23*NF EN 60749-23:2004 history

• 2004 NF C96-022-23*NF EN 60749-23:2004 Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life.