PN T01504-09-1987
Transistors Measuring methods Leakage currents ICER, ICES, ICEV and Ir

Standard No.: PN T01504-09-1987
Release Date: 1987
Published By: PL-PKN
Latest: PN T01504-09-1987

PN T01504-09-1987 history

1987 PN T01504-09-1987 Transistors Measuring methods Leakage currents ICER, ICES, ICEV and Ir

PN T01504-09-1987 -All Parts

PN T01504-01-1987 Transistors Measuring methods Static value of the forward current transfer ratio hus and base-emitter voltage Ube PN T01504-02-1987 Transistors Measuring methods Collector-emitter saturation voltage ?/C?-sat and base-emitter saturation voltage UBEat PN T01504-04-1987 Transistors Measuring methods Breakdown voltages U(BR) CBO and U(BR) ebo PN T01504-05-1987 Transistors Measuring methods Collector-base and emitter-base cut-off currents ICB0 and /?B0 PN T01504-10-1987 Transistors Measuring tnethod Collector-emitter sustaining voltage UcEO(sm) and Uceiusus) PN T01504-21-1987 Transistors Measurint! methods Forward current transfer ratio /!2i, at Iow fre?uency PN T01504-22-1987 Transistors Measuring methods Collector-base and emitter-base capacitances Ccbo and Cebo PN T01504-24-1987 Transistors Measuring methods Forward current transfer ratio \)i2u\ at high fre?uency and transition fre?uency fr PN T01504-25-1989 Transistors Measurement of time-constant Km, ? Cc of feedback circuit PN T01504-59-1987 Diodes Measuring methods Reverse recovery time t? and reverse recovery current i,r PN T01504-60-1987 Diodes Measuring methods Instant and peak forward recovery voltages Ufr, Ufrm and forward recovery time tfr PN T01504-61-1987 Diodes Measuring methods Recovered charge Q, PN T01504-67-1987 Diodes Measuring methods Series equivalent resistance

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