BS EN 60749-33:2004
Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased autoclave
- Standard No.
- BS EN 60749-33:2004
- Release Date
- 2004
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN 60749-33:2004
- Replace
- 02/206197 DC-2002
- Scope
- The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetic packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors passing through it. This test is used to identify failure mechanisms internal to the package and is destructive.
BS EN 60749-33:2004 history
- 2004 BS EN 60749-33:2004 Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased autoclave
