SANS 3497:1990
Metallic coatings - Measurement of coating thickness - X-ray spectrometric methods

Standard No.
SANS 3497:1990
Release Date
1990
Published By
ZA-SANS
Status
 2008-11
Replace By
SANS 3497-2008
SANS 3497:2008
Latest
SANS 3497-2008
SANS 3497:2008
Scope
This International Standard specifies methods for measuring the thickness of metallic coatings by the use of X-ray spectrometric methods. These methods permit the simultaneous measurement of some 3-layer systems. 2. The measuring methods to which this International Standard applies are fundamentally ones which determine the mass per unit area. Using a knowledge of the density of the coating material, the results of measurements can also be expressed as linear thickness of the coating. 3. The practical measurement ranges of given coating materials are largely determined by the acceptable measurement uncertainty and may differ depending upon the instrument system and operating procedure used. A table of typical ranges for common materials is given in annex A.

SANS 3497:1990 history

  • 0000 SANS 3497-2008
  • 1990 SANS 3497:1990 Metallic coatings - Measurement of coating thickness - X-ray spectrometric methods



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