EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Incorporates Amendment A1: 2011)
European Committee for Electrotechnical Standardization（CENELEC）
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EN 60749-30:2005
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2005EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Incorporates Amendment A1: 2011)