EN 62374:2007
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

Standard No.

EN 62374:2007

Release Date

2007

Published By

European Committee for Electrotechnical Standardization（CENELEC）

Latest

EN 62374:2007

EN 62374:2007 history

• 2007 EN 62374:2007 Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films