EN 60749-19:2003 Semiconductor devices - Mechanical and climatic test methods Part 19: Die shear strength (Incorporating Corrigendum June 2003; Incorporates Amendment A1: 2010)
European Committee for Electrotechnical Standardization（CENELEC）
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2003EN 60749-19:2003 Semiconductor devices - Mechanical and climatic test methods Part 19: Die shear strength (Incorporating Corrigendum June 2003; Incorporates Amendment A1: 2010)